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APPLIED PHYSICS: STUDY RESULTS FROM M.P. LORIKYAN AND COLLEAGUES IN THE AREA OF APPLIED PHYSICS PUBLISHED
Science Letter
March 17, 2009
According to recent research from Yerevan, Armenia, "Porous dielectric
detectors (PDDs) can expand the methods of image registration of
charged particles, neutrons, and x rays to a great extent; however
they are not sufficiently studied yet."
"Recently it was revealed that multiwire and microstrip PDDs operate
stably in dc mode. This paper presents a new two-dimensional microanode
image PDD (MAIPDD)," wrote M.P. Lorikyan and colleagues (see also
Applied Physics).
The researchers concluded: "Also, preliminary results of investigation
of MAIPDD for 5.9 keV x rays and two types of microstrip PDDs are
presented."
Lorikyan and colleagues published their study in the Journal of
Applied Physics (Microanode image porous dielectric detector. Journal
of Applied Physics, 2009;105(2):24503).
For additional information, contact M.P. Lorikyan, Yerevan Physics
Institute, 2 Alikhanian Br Str, Yerevan 0036, Armenia.
Publisher contact information for the Journal of Applied Physics
is: American Institute Physics, Circulation & Fulfillment Division,
2 Huntington Quadrangle, Ste. 1 N O 1, Melville, NY 11747-4501, USA.
Science Letter
March 17, 2009
According to recent research from Yerevan, Armenia, "Porous dielectric
detectors (PDDs) can expand the methods of image registration of
charged particles, neutrons, and x rays to a great extent; however
they are not sufficiently studied yet."
"Recently it was revealed that multiwire and microstrip PDDs operate
stably in dc mode. This paper presents a new two-dimensional microanode
image PDD (MAIPDD)," wrote M.P. Lorikyan and colleagues (see also
Applied Physics).
The researchers concluded: "Also, preliminary results of investigation
of MAIPDD for 5.9 keV x rays and two types of microstrip PDDs are
presented."
Lorikyan and colleagues published their study in the Journal of
Applied Physics (Microanode image porous dielectric detector. Journal
of Applied Physics, 2009;105(2):24503).
For additional information, contact M.P. Lorikyan, Yerevan Physics
Institute, 2 Alikhanian Br Str, Yerevan 0036, Armenia.
Publisher contact information for the Journal of Applied Physics
is: American Institute Physics, Circulation & Fulfillment Division,
2 Huntington Quadrangle, Ste. 1 N O 1, Melville, NY 11747-4501, USA.