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Studies From A.O. Aboyan Et Al Provide New Data On Crystal Research

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  • Studies From A.O. Aboyan Et Al Provide New Data On Crystal Research

    STUDIES FROM A.O. ABOYAN ET AL PROVIDE NEW DATA ON CRYSTAL RESEARCH

    Technology Business Journal
    March 30, 2010

    "Structural distortions in nonpolar, particularly, in semiconducting
    silicon crystals, caused by constant electric field have been disclosed
    by means of X-ray interferometry," investigators in Yerevan, Armenia
    report.

    "It was shown that in the field both the direction of moire fringes
    and the frequency (period) are changed, and the moire patterns
    disappear at values of potential difference in excess of 1.5 kV,"
    wrote A.O. Aboyan and colleagues.

    The researchers concluded: "The moire pattern obtained under the action
    of electrostatic field is independent of the direction (polarity)
    of the field, the pictures for both the polarities being completely
    identical."

    Aboyan and colleagues published their study in Crystal Research and
    Technology (Structural distortions of semiconducting silicon crystals
    caused by constant electric field. Crystal Research and Technology,
    2010;45(2):140-144).

    For additional information, contact A.O. Aboyan, State Engn University
    Armenia, Dept. of Phys, Teryan Str 105, Yerevan, Armenia.

    The publisher of the journal Crystal Research and Technology can
    be contacted at: Wiley-V C H Verlag GmbH, PO Box 10 11 61, D-69451
    Weinheim, Germany.
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